360 exp 0 Digital Phase Detector with 100-KHz Bandwidth

摘要

The general availability of digital circuit components with propagation delay times of a few nanoseconds makes a digital phase detector with good bandwidth feasible. Such a circuit has a distinct advantage over its analog counterpart because of its linearity over wide range of phase shift. A phase detector that is being built at Los Alamos National Laboratory for the Fusion Materials Irradiation Test (FMIT) project is described. The specifications are 100-kHz bandwidth, linearity of +- 1 exp 0 over +- 180 exp 0 of phase shift, and 0.66 exp 0 resolution. To date, the circuit has achieved the bandwidth and resolution. The linearity is approximately +- 3 exp 0 over +- 180 exp 0 phase shift. (ERA citation 06:016011)