Chromium Thickness Measurement by X-Ray Fluorescence

摘要

Chromium plating thickness on a gold surface was measured using x-ray spectroscopy. In the 10- to 15- mu m range of interest, adequate resolution and repeatability were achieved with a count time of less than 2 minutes. The success of this application suggests that the technique might be adapted to a wide range of coating thickness measurement problems. (ERA citation 06:024098)