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Investigation of Radiation Defects in Solids Using the EXAFS Method

机译:用EXaFs方法研究固体中的辐射缺陷

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The EXAFS method is proposed as a more informative, universal one to investigate the radiation defects in solids. The successful results as obtained by the author using the synchrotron radiation source are reported for the first time. The measurements were carried out in GaAsP crystals irradiated with 50 MeV electrons. (Atomindex citation 16:043287)

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