Determination of the Specific Site Occupation of Rare Earth Additions in Y sub 1 sub 7 SM sub 0 sub 6 Lu sub 0 sub 7 Fe sub 5 O sub 12 Thin Films by the Orientation Dependence of Characteristic X-Ray Emissions

摘要

The orientation dependence of characteristic x-ray emissions have been used to determine specific site occupations of Rare Earth additions in epitaxially grown films of Y sub 1 sub 7 Sm sub 0 sub 6 Lu sub 0 sub 7 Fe sub 5 O sub 12 . A theoretical formulation based on the assumption of highly localized inner shell excitations was used not only to predict specific site sensitive orientations, but also to refine experimentally observed data employing a constrained least squares analysis to give probabilities for the occupation of the RE additions in the different crystallographic sites. Thus, it has been shown that in this compound the preference for the RE additions is a predominantly octahedral occupation with a probability greater than or equal to 95%. Some of the assumptions and limitations of the technique have also been discussed. (ERA citation 09:008068)