Electron Probe Micro-Analysis of Irradiated Triso-Coated UO sub 2 Particles, (2)

摘要

Irradiated Triso coated UO sub 2 particles were observed by means of electron probe microanalyzer. Although the present experiment was preliminary, palladium accumulation at inner surface of the SiC layers and palladium penetration into the SiC layers were observed. Palladium was detected at all levels of palladium amount in a particle from 1.1 x 10 exp 15 to 3.6 x 10 exp 15 atoms/particle. Although palladium was detected on both hot and cold sides of the particle, the amount of paladium and the number of accumulation positions on the cold side were greater than those on the hot side of the particle. Cerium, tellurium, and barium were also detected at inner surface of the SiC layers as well as in the buffer-PyC layers. Detection of chlorine was tried in the coating layers but was prevented by the epoxy resin, since it contained chlorine. (Atomindex citation 16:024733)