Accurate Structure Factor Determination of Binary Cubic Solid Solutions

摘要

The Critical Voltage technique (V/sub C/) in HEED can measure low angle x-ray structure factors of crystalline materials to within 0.1% provided accurate higher angle structure factors and Debye-Waller factors are available. The extension of this technique to a range of alloys in the systems CuAu, CuAl and FeCr is presented. (ERA citation 11:007452)