Solid-State Diffusion as Measured by Microbeam Analytical Techniques: A Comprehensive Bibliography

摘要

The techniques included in this bibliography are: (1) Electron Probe Microanalysis, (2) Analytical Electron Microscopy, (3) Auger Electron Spectroscopy and Scanning Auger Microanalysis, (4) Secondary Ion Mass Spectroscopy and Ion Microprobe, (5) Rutherford (and other ion) Backscattering, and (6) Specialized X-ray Techniques including Extended X-Ray Absorption Fine Structure and Variable Incidence Angle X-Ray Fluorescence. This bibliography brings together the literature references which discuss the quantitative analysis of diffusion phenomena as investigated with the group of microbeam techniques. The references are divided into categories by technique. (ERA citation 10:034096)