Comparison of Film-Based Tomography and Computed Tomography for Advanced Ceramic Materials

摘要

An X-ray computed tomography (CT) imaging system and an analog tomographic system were used to examine a green-state Si sub 3 N sub 4 test specimen. The CT system used was a state-of-the-art medical CT scanner with a polychromatic source. The film-based tomography system was a Siemens Optiplanimat with tungsten target and 2.5-mm Al filtration. It was operated in one scan pattern. Single-emulsion industrial film was used to increase spatial resolution. Results show that with the equipment and test specimens used, computed tomography is superior in size of defect detectable. 11 refs., 15 figs. (ERA citation 13:009321)