首页> 美国政府科技报告 >Measurement of Structure Factors and Determination of Crystal Thickness by Electron Diffraction

【24h】

Measurement of Structure Factors and Determination of Crystal Thickness by Electron Diffraction

机译：结构因素的测量及电子衍射测定晶体厚度

获取原文

页面导航

摘要
著录项
相似文献
相关主题

摘要

The paper is a survey of various methods for the measurement of structure factors and the determination of crystal thickness by electron diffraction. 30 refs. (ERA citation 13:023777)

著录项

作者
Gjoennes, J. ; Steeds, J. W.;
展开▼
作者单位

展开▼
年度 1987
页码 1-19
总页数 19
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Structure Factors; Electron Diffraction; Crystallography; Accuracy; Crystal Structure; Kikuchi Lines; Laue Method;

机译：结构因素;电子衍射;晶体学;精度;晶体结构; Kikuchi线;劳厄法;

相似文献

外文文献
中文文献
专利

1. THICKNESS DISTRIBUTION OF ILLITE CRYSTALS IN SHALES. Ⅰ: X-RAY DIFFRACTION VS. HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY MEASUREMENTS [J] . TERESA DUDEK, JAN SRODON, DENNIS D. EBERL, Clays and clay minerals . 2002,第5期

机译：页岩中伊利石晶体的厚度分布。 Ⅰ：X射线衍射VS。高分辨率透射电子显微镜测量
2. DETERMINATION OF INTERNAL STRESSES IN CYCLICALLY DEFORMED COPPER SINGLE CRYSTALS USING CONVERGENT-BEAM ELECTRON DIFFRACTION AND DISLOCATION DIPOLE SEPARATION MEASUREMENTS [J] . M.E.Kassner, M.-T.Perez-Prado, K.S.Vecchio Acta Materialia . 2000,第17期

机译：会聚束电子衍射和位移双极分离法测定循环形变的铜单晶的内部应力
3. Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector [J] . Nakazawa K., Mitsuishi K., Shibata K., Ultramicroscopy . 2020,第1期

机译：局部厚度和组成测量通过像素化检测器获得的二进制非晶体材料的扫描会聚光束电子衍射
4. Ab Initio Structure Determination from Three-Dimensional Electron Diffraction Intensities Collected from Inorganic Crystals of Moderate Thickness [C] . International centennial symposium on the electron . 1998

机译：AB Initio结构从中等厚度的无机晶体收集的三维电子衍射强度测定
5. Surface structure determinations of crystalline ionic thin films grown on transition metal single crystal surfaces by low -energy electron diffraction. [D] . Roberts, Joel Glenn. 2000

机译：通过低能电子衍射确定过渡金属单晶表面上生长的晶体离子薄膜的表面结构。
6. Comparing serial X-ray crystallography and microcrystal electron diffraction (MicroED) as methods for routine structure determination from small macromolecular crystals [O] . Alexander M. Wolff, Iris D. Young, Raymond G. Sierra, 2020

机译：比较串行X射线晶体学和微晶电子衍射（MicroED）作为从小分子大分子晶体确定常规结构的方法
7. The estimation of crystal thickness and the restoration of structure-factor modulus from electron diffraction: a kinematical approach. [O] . Tang D., Jansen J., Zandbergen H.W., 1995

机译：通过电子衍射估算晶体厚度和恢复结构因子模量：一种运动学方法。

Measurement of Structure Factors and Determination of Crystal Thickness by Electron Diffraction

摘要

著录项

相似文献

相关主题

期刊订阅