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Automatic Test System for the L3 Muon Drift Chamber Amplifiers

机译:L3 muon漂移室放大器自动测试系统

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We describe the system we developed to test the linearity of wire chambers amplifiers of the muon spectrometer presently in construction for the L3 experiment at LEP. The system, controlled by an Apple II computer, is capable of localizing both defective components and faults in the printed board. It will be used to perform the large scale quality control of the amplifier cards. (Atomindex citation 19:002498)

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