Evaluation of Local Strain Fields at (001) Twist Boundaries in Silicon with Transmission Electron Microscope Diffraction: Final Subcontract Report

摘要

This report describes work done to evaluate the local strain fields at (001) twist boundaries in silicon by means of transmission electron microscope diffraction studies. The research focused on silicon solar cells fabricated from polycrystalline materials. The intent was to investigate the way in which the electrical activity at grain boundaries affects the performance of the solar cell, with a view to ultimately increasing the stability of this semiconductor material. (ERA citation 12:036635)