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Characterization of Electron-Beam Induced Damage Structures in Natural Fluorite, CaF/sub 2/, by Analytical Electron Microscopy.

机译：用分析电子显微镜表征天然萤石CaF / sub 2 /中电子束诱导的损伤结构。

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Naturally occurring fluorite, CaF/sub 2/, develops a particular highly ordered damage structure when exposed to the primary beam in the transmission electron microscope (TEM). This structure has been variously described as ''ordered defect aggregates'', a ...

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作者
D. F. Blake L. F. Allard C. J. Echer F. Freund;
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年度 1988
页码 1-14
总页数 14
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Calcium Fluorides; Damage; Electron Beams; ERDA/360605; Experimental Data; Fluorite; Physical Radiation Effects; Transmission Electron Microscopy;

机译：氟化钙;损伤;电子束; ERDa / 360605;实验数据;萤石;物理辐射效应;透射电子显微镜;

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1. Spectroscopic characteristics of natural fluorite induced by electron-beam irradiation [J] . Mihyun Kim, Yongsub Yoon, Minkyimg Kang Journal of Ceramic Processing Research. (Text in English) . 2012,第5期

机译：电子束照射引起的天然萤石的光谱特性
2. Evaluation of damage induced by electron-beam irradiation to metal-oxide semicondoctor gate pattern and method for damage-free inspection [J] . Miyako Matsui, Syuntaro Machida, Toshiyuki Mine, Journal of Microlithography, Microfabrication, and Microsystems. (JM3) . 2007,第1期

机译：电子束辐照对金属氧化物半导体栅极图案的损伤评估和无损检查方法
3. In situ transmission electron microscopy of electron-beam induced damage process in nuclear grade graphite [J] . Karthik C., Kane J., Butt D.P., Journal of Nuclear Materials: Materials Aspects of Fission and Fusion . 2011,第3期

机译：核级石墨中电子束诱导损伤过程的原位透射电子显微镜
4. Electron-beam excited Ce:LiCAF spectroscopy by a table-top-sized, low-jitter, 3-MeV picosecond electron-beam source with a photo cathode [C] . Yuji SUZUKI, Toshimasa KOZEKI, Hideyuki OHTAKE, Advanced Solid-State Lasers . 2002

机译：台式尺寸，低抖动，3 MeV皮秒电子束源和光阴极，通过电子束激发Ce：LiCAF光谱
5. Structural Investigation of Electron-beam Sensitive Zeolites and Metal-organic-frameworks Using Analytical Transmission Electron Microscopy [D] . Kumar, Prashant 2018

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6. Antigenic characterization of small round-structured viruses by immune electron microscopy. [O] . S Okada, S Sekine, T Ando, 1990

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7. Damage and strain in single-layer graphene induced by very-low-energy electron-beam irradiation [O] . Murakami Katsuhisa, Kadowaki Takuya, Fujita Jun-ichi 2013

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8. Electron-beam induced damage in thin insulating films on compound semiconductors [R] . Pantic, Dragan M. 1989

机译：复合半导体薄绝缘薄膜中的电子束诱导损伤

Characterization of Electron-Beam Induced Damage Structures in Natural Fluorite, CaF/sub 2/, by Analytical Electron Microscopy.

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