Initial Assessment of the Use of an Ion Beam to Simulate Soft X-Ray Effects on a Multi-Layer Surface.

摘要

Ion beams can be used to simulate the effects of soft x-ray energy deposition in single-component materials like aluminum. The extension of this application to multi-layered materials such as are found on optical surfaces is considered here for a reference surface consisting of six layers of alternating ZnS and ThF sub 4 , with each layer .3 micrometer thick. Energy deposition by 1--10 keV blackbody spectra and by 100 keV--10 MeV protons are calculated. In this reference surface, ion beams do not reproduce the differential energy deposition profiles produced by soft x-rays, and in fact produce deposition gradients of the wrong polarity. To the extent that the x-ray effects depend on the differential energy deposition, ion beams do not provide a good simulation of soft x-ray effects on the reference multi-layered surface. 5 refs., 7 figs., 1 tab. (ERA citation 13:052775)