Magnetotransport Studies of Epitaxial Cr Thin Films.

摘要

We report the results of transport measurements on epitaxial Cr thin films. The variation of T(sub N) (the Neel transition) with respect to the film thickness is discussed in terms of the stress in the film. In addition, the temperature dependence of the magnetoresistance (MR) and Hall effect for temperatures from 4 K to 150 K are also discussed, with particular attention to the temperature dependence of the non-linear portion of the Hall data. 8 refs., 6 figs.