(International Conference on Synchrotron Radiation Application, with Visits to Beijing, Hefei, and Shanghai, China, April 30-May 18, 1989): Foreign Trip Report.

摘要

The purpose of this trip was to present an invited talk on the development of metrology instrumentation for grazing incidence optics to the International Conference on Synchrotron Radiation Application; to visit various optics laboratories and assess the current state of Chinese optical metrology and fabrication technology; and to continue a cultural and scientific exchange with collaborators who have visited and worked in my laboratory. Details of these presentations are given in this paper.