Pinhole diagnostics system for measurement of aberrations at the Argonne National Laboratory Neutral Particle Beam Test Stand.

摘要

The primary beam characterization device at the Argonne National Laboratory Neutral Particle Beam Test Stand is a pinhole diagnostics system. Characteristics of the system, its uses, and illustrative examples of pinhole diagnostics measurements are discussed. In addition, an approach for comparing pinhole diagnostics measurements with results from the WAFFOG beam sensor is presented. (ERA citation 16:001014)