Results from Vernier Scans During the RHIC 2008 PP Run

摘要

Using the vernier scan or Van der Meer scan technique, where one beam is swept stepwise across the other while measuring the collision rate as a function of beam displacement, the transverse beam profiles, the luminosity and the effective cross section of the detector in question can be measured. This report briefly recalls the vernier scan method and presents results from the 100 GeV 2008 RHIC polarized proton (pp) run.