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Slow positron studies of hydrogen activation/passivation on SiO2/Si(100) interfaces.

机译:在siO2 / si(100)界面上的氢活化/钝化的慢正电子研究。

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The hydrogen atoms are one of the most common impurity species found in semiconductor systems owing to its large diffusivity, and are easily incorporated either in a controlled process like in ion implantation or in an uncontrolled process like the one at ...

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