首页> 美国政府科技报告 >X-ray studies of microstructures in semiconductors and superconducting materials. Annual technical progress report, July 1, 1990--June 30, 1991.
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X-ray studies of microstructures in semiconductors and superconducting materials. Annual technical progress report, July 1, 1990--June 30, 1991.

机译:半导体和超导材料中微结构的X射线研究。年度技术进步报告,1990年7月1日至1991年6月30日。

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摘要

Several different experimental investigations were carried out during the present report period. These include x-ray studies of semiconductors, high-(Tc) superconductors, and various thin films using synchrotron radiation (especially soft x-ray experiment ...

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