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Analysis of parametric drift of a MESFET-based GaAs MMIC due to 125(degrees)C storage

机译:由125(度)C存储引起的基于mEsFET的Gaas mmIC的参数漂移分析

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摘要

Microwave parameters drifted significantly for two out of twenty- nine GaAs MESFET-based MMICs during ten weeks of storage at 125(degrees)C and 150(degrees)C. Analysis using measured, post- storage, FET characteristics and the microwave behavior indicates that all of the FETs in the MMICs drifted, most likely due to contamination.

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