Cross-sectional TEM studies of DIGM in irradiated Au-Cu bilayers

摘要

Cross-sectional transmission electron microscopy was used to study diffusion-induced gain boundary migration (DIGM) in irradiated and annealed Au/Cu bilayers. Using this technique, in combination with small probe x-ray energy dispersive spectroscopy, DIGM alloyed zones in Au were identified in an irradiated sample.