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Hard x-ray microimaging techniques based on phase zone plates

机译:基于相位带板的硬X射线微成像技术

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Phase zone plates of high focusing efficiency and submicron resolution have been demonstrated in the hard x-ray region. A scanning microscope based on these focusing optics will create many new applications. Preliminary results in the applications of the microscope are reported here. In the area of imaging, we have utilized absorption contrast to clearly identify the locations of Au and Ni constituents in a sample of two interleaved grids. Micro-EXAFS spectra has also been obtained on a Ni foil. Fluorescence from a nuclear fuel sample, as an example of microanalysis, has revealed the elemental distribution at the interfaces. Lastly, microdiffraction from AgBr crystallites has been studied. 5 figs, 7 refs.

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