Method and Apparatus for Determining Both Density and Atomic Number of a Material Composition Using Compton Scattering.

摘要

An x-ray backscatter tomography system includes a collimated x-ray source for directing a collimated beam towards a target at a select position and orientation, a first detector array for measuring photons scattered at a selected first angle, and a second detector array for measuring photons scattered at a selected second angle different from the first angle. The system also includes means responsive to the first and second detectors for calculating the density and atomic number of the target.