Thermomechanical Effects in Metal Field Emitter Structures.

摘要

Analytical and numerical results concerning thermal and mechanical effects in operating metal field emitter structures (tips, gates and anodes) are summarized. For the most part, it is found that such effects are too small to constitute a reliability threat unless the geometries (via their effect on heat sinking) or the operating frequencies (via their ac heating contribution) are extreme. For ideal structures of conventional (SRI-like) geometry under normal operating conditions the only two thermomechanical effects with the potential for triggering failure are; (1) anode heating due to electron impact and (2) Maxwell stress on the field emitter tip.