3rd European Symposium on X-Ray Topography and High Resolution Diffraction, X-TOP'96, Palermo, Italy, Hotel Torre Normanna, 22-24 April 1996. (Abstracts)

摘要

The third European symposium was held at the hotel Torre Normanna, Italy on 22-24th of April 1996. The purpose of this symposium is to discuss advanced X ray Topography methods and high resolution diffraction. The symposium also emphasizes instrumental developments, theoretical models and applications to crystal growth, surface and interfaces.