Site Characterization and Analysis Penetrometer System (SCAPS) Downhole Nd:YAG Laser-Based Laser Induced Fluorescence Validation Technology Demonstration Report.

摘要

This technology demonstration report documents the field and laboratory methods used to verify a downhole 266 nm Neodymium: Yttrium Aluminum Garnet (Nd:YAG) laser-induced fluorescence (LIF) sensing technology and presents demonstration results. Space and Naval Warfare Systems Center, San Diego (SSC San Diego), formerly NCCOSC RDTE DIV, has prepared this report following the guidelines in the Environmental Security Technology Certification Program (ESTCP) Program Offices' document, "Final Report Guidelines for Funded Projects" dated 6 February, 1996. The technology demonstration report is divided into ten sections. Section 1. provides a broad overview of the purpose and background of the demonstration and a description of the technology demonstration process. Section 2. describes the downhole 266 nm Nd:YAG Site Characterization and Analysis Penetrometer System (SCAPS) LIF technology sensor. Section 3. provides a description of the demonstration sites. Section 4. presents the demonstration approach with sampling and analytical procedures. Section 5. assesses system technical performance. Section 6. provides cost related information. Section 7. discusses regulatory issues. Section 8. outlines the technology implementation. Section 9. reviews lessons learned as a result of this demonstration. Section 10. provides references to cited documents.