X-Ray Measurements With Films Masked by Staggered Absorption Layers of Aluminum

摘要

A technique for measuring x-ray emissions within the photon energy range 1 keV to 10 keV is described. A staggered set of aluminum absorbers, supported by kimfoil, is used to mask x-ray-sensitive film. Response functions of aluminum and kimfoil absorbers, along with the response function of the film, provide reasonable energy discrimination. Integrated incident energy along with modest spectral resolution may be obtained by convolution of the transmission of x-rays through the aluminum absorber stack and the exposed film density. Synthetic and experimental data are presented. For discrete photon energies, within the range noted, at least (plus an minus 0.5 keV resolution is realized).