International IEEE Workshop on Experimentally Based FET Device Modelling RelatedNonlinear Circuit Design, 17-18 July 1997, Kassel, Germany

摘要

Table of Contents: Workshop Opening; DC/SS- Device Characterization Parasitics;Poster Opening; Signal Waveform and Pulsed Measurement Load Pull; Noise Measurement Nonlinear Noise in FETs; Optical Control of FETs; and Nonlinear Modeling and Circuit Design;.