Investigation of Deterministic and Stochastic Properties of Microwave/MillimeterWave Signals Generated in Laser Diodes with Short External Cavity

摘要

From a nonlinear dynamic point of view, Hopf bifurcation is responsible for theoccurrence of the high-frequency intensity oscillations. However, Hopt bifurcation is only the necessary condition. The necessary and sufficient conditions are that Hopf bifurcation occurs and the limiting point of existence of a higher-order mode is above the stability boundary of a lower-order mode. The noise characteristics of the high-frequency oscillations can be measured using the HP 3048A phase and amplitude noise measurement system.