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ESREF 98 - 9th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

机译：EsREF 98 - 第9届欧洲电子器件可靠性，失效物理和分析研讨会

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摘要

The Final Proceedings for ESREF 98 - 9th European Symposium on Reliability of Electron Devices from 5 October to 9 October 1998. This is an interdisciplinary conference. Topics include reliability of electron devices, including MEMs, failure physics and analysis.

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年度 1998
页码 1-512
总页数 512
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Symposia; Electronic equipment; Microelectronics; Electromechanical devices; Failure(Electronics); Electrical engineering; Denmark;

机译：专题讨论会;电子设备;微电子;机电设备;故障（电子）;电气工程;丹麦;

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ESREF 98 - 9th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

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