首页> 美国政府科技报告 >International Conference on Defects in Semiconductors (19th), ICDS-19, Held in Aveiro, Portugal on 21-25 July 1997, Part 1
【24h】

International Conference on Defects in Semiconductors (19th), ICDS-19, Held in Aveiro, Portugal on 21-25 July 1997, Part 1

机译:国际半导体缺陷会议(第19次),ICDs-19,于1997年7月21日至25日在葡萄牙阿威罗举行,第1部分

获取原文

摘要

Emphasis is given to the properties of wide-bandgap materials, including quantum enhancement of effective band-gaps. semiconductors (silicon and III-V materials), plus radiation effects on detector materials. Topics also include: (1) GaN, (2) Nanostructures, (3) Large bandgap materials, (4) defects in epitaxial growth, (5) self-organizing rare earth, (6) metastable defects, (7) pairs and complexes, (8) defect reactions, and (9) radiation effects on detector material.

著录项

相似文献

  • 外文文献
  • 中文文献
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号