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Cosmic Radiation at Aircraft Altitudes (neutrons) Influences on the Single Event Upset SEU Sensitivity for Low-Voltage Electronic Devices

机译:飞机高度(中子)的宇宙辐射对低压电子设备的单事件翻转sEU灵敏度的影响

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摘要

This report results from a contract tasking University of Linkoping as follows: The contractor will investigate single event upset phenomenon in low voltage microelectronics. The contractors will study and document the effects of cosmic radiation at the aircraft environment (neutrons).

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