Progress Report on X-Ray Diffraction Measurements on New Low-Thermal Conductivity Thermoelectric Materials

摘要

Thermoelectric devices and materials have potential applications in refrigeration and power generation. An X-ray diffraction study was made documenting the phase and the lattice parameter of both some new thermoelectric compounds and some previously known compositions. The materials contained primarily Ir, Rh, Sb, Sn, and Pt. Improvements in the measurement procedures resulted in improved accuracy in lattice parameter measurements and in peak intensity measurements.