首页> 美国政府科技报告 >Microelectronic Status Analysis and Secondary Part Procureability Assessment Process Tools and Procedures Development and Implementation
【24h】

Microelectronic Status Analysis and Secondary Part Procureability Assessment Process Tools and Procedures Development and Implementation

机译:微电子状态分析和二次部件可采性评估过程工具和程序开发和实施

获取原文

摘要

The Industrial Operations Division (IOD), Systems Engineering and Production Directorate (SEPD), AMCOM has the mission end function of providing microelectronic technology assessments and producibility and supportability analyses for AMCOM weapon systems. IOD evaluates the impacts of nonavailability of microelectronic parts on the life cycle supportability of the AMCOM weapon systems and evaluates the producibility of AMCOM weapon systems. IOD required engineering support in performing microelectronic technology and availability assessments for several hundred items and in assessing the impact of nonavailability on AMCOM weapon systems. IOD also required engineering support developing state of the art microelectronic technology and availability assessments tools and procedures for AMCOM weapon systems. The Systems Management and Production Laboratory at UAH was tasked to provide this engineering support and analytical capability.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号