Flight Test Results From the Ultra High Resolution, Electro-Optical Framing Camera Containing a 9216 by 9216 Pixel, Wafer Scale, Focal Plane Array

摘要

The details of the fabrication and results of laboratory testing of the Ultra High Resolution Framing Camera containing onchip forward image motion compensation were presented to the SPIE at Airborne Reconaissance XXII in 1998. Three airborne flight tests of the Camera system have since been conducted with excellent results. This paper summarizes predicted performance for the Camera and presents some of the flight test imagery and data.