Ultrahigh Strength-Tough Surface Coatings Via Controlled Nanostructures

摘要

In the final phase of this contract a new method for direct determination of strains in amorphous thin films using Grazing Incidence X-ray Scattering (GIXS) data of is described. Results for the residual stress distributions for sputter deposited B4C and SiC are compared to results obtained from more traditional x-ray methods such as Double Crystal X-ray Topography (DCDT). This new approach directly measures quantities intrinsic to the film independent of the type of substrate used for the coating. This allows measurements on complex surfaces ordinarily encountered in engineering applications. The GIXS-based technique yielded somewhat larger strains than the DCDT technique. The implications of these results will be reported in a series of future articles now in preparation.