MQW Refractive Index Modulators for Interfacing Parallel Electronic Computer to Serial Fiber-Links

摘要

During the course of this program, we have developed a measurement setup to measure index of refraction in III-V thin film semiconductors and investigated theoretically and experimentally the refractive index modulation in MOW and DX materials. We have shown that although small in magnitude index modulation exists above absorption saturation. Although we spent considerable effort in growing DX materials we were not able to demonstrate conclusively optical modulation in this type of materials. In this report, we summarize the refractive index modulation in MQW materials beyond absorption saturation, describe the phase-shift interferometry methods, and detail the measurement results. We also expand on our research on DX center materials.