Integrated Instrumentation System for the Surface Characterization of Organic Electronic Materials and Devices

摘要

The AFOSR DURIP grant has helped us to setup a dual-chamber multi- technique (UPS and XPS) surface analysis system, purchased from Omicron Nano Technology. This is the most important equipment we have obtained in recent years. This instrument allows us to measure Ultra-violet Photoelectron Spectroscopy (UPS) and X-ray Photoelectron Spectroscopy (XPS), which are indeed the first such system at UCLA campus. The instrumentation was installed in May, 2004, and fully operational in July. Some important results have produced from this instrument even for its short operation time. These results are reports in the report in detail.