Importance of Atomic Packing in Determining Dielectric Permittivities

摘要

The role of the network structure in determining the dielectric constant of binary and ternary oxide insulators is outlined. Seemingly anomalous behavior observed in rare-earth sesquioxides, Ta(2)O(5)-TiO(2) mixed oxides, lanthanum aluminate and dilute Zr(x)Si(y)O(2) is discussed in terms of the atomic structure. Physical examination of the relevant properties of these materials should lead to an understanding of how to engineer the dielectric constant.