Materials on the International Space Station Experiment (MISSE): Optical Analysis of Molecular Contamination on PEC1 Tray 2

摘要

Silicon wafers were mounted on the exterior of the International Space Station as a part of MISSE. Post-flight ellipsometry and reflectometry were employed to show that the silicon wafers gained about a 420-A-thick layer of a silica-like contaminant with BRDF scatter values around 1 x l0% per steradian.