Femtosecond Laser Threshold and Nonlinear Characterization in Bulk Transparent SiC Materials (Preprint).

摘要

Semi-insulating and conducting SiC crystalline transparent substrates were studied after being processed by femtosecond laser radiation. Z- scan and damage threshold experiments were performed on both SiC bulk materials to determine each samples' nonlinear and threshold parameters. 'Damage' in this text refers to an index of refraction modification as observed visually under an optical microscope. In addition, a study was performed to understand the damage threshold as a function of numerical aperture.