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The Reliability of Electronic Components For Use in Remington Rand Univac Ground-Based Computer Systems VOLUME IIIB:SIMULATED-USE LIFE-TEST DATA (DIODES)

机译：用于Remington Rand Univac地基计算机系统的电子元件的可靠性第二卷：模拟使用寿命测试数据（二极管）

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Presentation of Type HD2193 diode data for the simulated-use load-life experiment was designed tó provide summarized statistics that could be used in a variety of computations which might arise in the design, opera¬tion, and maintenance of a ground-based computer system.

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J. E. Drennan; A. E. Mace; L. H. Stember;
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年度 1958
页码 1-156
总页数 156
原文格式 PDF
正文语种 eng
中图分类工业技术;
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专利

1. Maximum likelihood analysis of component reliability using masked system life-test data [J] . Usher J.S., Hodgson T.J. IEEE Transactions on Reliability . 1988,第5期

机译：使用屏蔽的系统寿命测试数据对组件可靠性进行最大似然分析
2. Methods and Procedures for Computer Based Handling of Components Reliability Data at FTL (The Swedish Military Electronics Laboratory) [J] . Broberg Henrik V. J. Reliability, IEEE Transactions on . 1974,第3期

机译：在FTL上基于计算机处理组件可靠性数据的方法和程序（瑞典军事电子实验室）
3. Reliability analysis of accelerated life-test data from a repairable system [J] . Guida M., Giorgio M. IEEE Transactions on Reliability . 1995,第2期

机译：来自可修复系统的加速寿命测试数据的可靠性分析
4. Automotive electronics in space: combining the advantages of high reliability components with high production volume [C] . McDermott, S.A., Jacobovits, . 2002

机译：太空中的汽车电子产品：结合高可靠性组件的优势和高产量
5. Modeling and Characterization of High-power Electronic Devices: System Analysis of Laser Diodes with Flash Boiling and GaN HEMT Reliability Modeling [D] . Schlenker, Evan L. 2018

机译：高功率电子设备的建模与鉴定：闪光沸腾和GAN HEMT可靠性造型激光二极管的系统分析
6. Spatial distribution of clinical computer systems in primary care in England in 2016 and implications for primary care electronic medical record databases: a cross-sectional population study [O] . Evangelos Kontopantelis, Richard John Stevens, Peter J Helms, 2018

机译：2016年英格兰初级保健中临床计算机系统的空间分布及其对初级保健电子病历数据库的影响：横断面人群研究
7. Reliability allocations, assessments, and analysis report. Volume I. Reliability model, predictions, and allocations. Volume II. System failure-mode effects and criticality analysis. Volume III. Trend data [O] . 1971

机译：可靠性分配，评估和分析报告。第一卷。可靠性模型，预测和分配。第二卷。系统故障模式影响和关键性分析。第三卷。趋势数据
8. FINAL REPORT on The Reliability of Electronic Components For Use in Remington Rand Univac Ground-Based Computer. Systems VOLUME IIIA:SIMULATED-USE LIFE-TEST DATA (RESISTORS) to Remington Rand Univac [R] . J. E. Drennan, A. E. Mace, L. H. Sterhber 1959

机译：关于Remington Rand Univac地面计算机使用的电子元件可靠性的最终报告。系统第二卷：模拟使用寿命测试数据（电阻）给Remington Rand Univac

The Reliability of Electronic Components For Use in Remington Rand Univac Ground-Based Computer Systems VOLUME IIIB:SIMULATED-USE LIFE-TEST DATA (DIODES)

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