Reliability Test Method for 'One-Shot' Items.

摘要

As a result of many reliability problems which have plagued procuring agencies in the missile and space programs, increased emphasis has been placed on the development of improved reliability demonstration test methods. In this connection, the Army has advocated increased use of the 'test-to-failure' concept to establish the existence of satisfactory margins of reliability with respect to critical factors. This philosophy has the advantage in that statistical statements can be made regarding reliability on the basis of relatively small samples. This paper will discuss the application of this general concept to a particular class of hardware.