CONDENSER TILTING DEVICE FOR DIFFRACTED BEAM MICROSCOPY IN THE RCA-EMU3 ELECTRON MICROSCOPE

摘要

Diffracted beam electron microscopy is a valuable and relatively simple technique when examining thin foils containing either more than one phase or a defect structure giving rise to diffraction spots other than the original matrix or defects such as dislocations, which become visible in certain reflections. Using for instance, one of the extraneous spots to form a dark field image, it is possible to show the location of precipitates or the defect structure.