Production Engineering Measure. Production of a Silicon Planar Epitaxial Transistor with a Maximum Operating Failure Rate of 0.001% Per 1000 Hours at a Confidence Level of 90% at 25c

摘要

This report contains a summary of the results of the efforts expended in the Reliability Engineering area. Also contained are summaries of process change evaluation experiments, acceleration factor experiments and large scale testing. Comparisons are made of parameter distribution and stability, failure rate and mechanical ruggedness between the several processes developed during this Production Engineering Measure Program. (Author)