The Formation, Behavior, and Properties of Stacking Faults in Crystalline Materials

摘要

A review is given of the status of investigations at the end of the year, the primary approach still being X-ray techniques. The investigations included (1) determination of fault probability in the presence of applied or residual tensile stress for alpha brass in tension where the probability for a given strain is low (AD-602 114); (2) X-ray diffraction from niobium and tantalum deformed by wire drawing; (3) peak shifts caused by layer faults in Cr-1 Re and Cr-35 Re alloys; (4) X-ray diffraction from explosively deformed silicon bronze where line broadening appears to be caused by particle size not strain; (5) methods for calculation of electron diffraction patterns containing twin reflections; (6) elliptical diffraction patterns from faults in graphite; (7) possible standardization of crystallographic formulas for hexagonal lattices; and (8) extrinsic faults for cerium deformed (by filing) at room temperature as shown by peak shifts.