Production Engineering Measures (Pem) for Microelectronic Circuitry and Milliwatt Logic Semiconductor Integrated Circuits

摘要

Work accomplished during the reporting period was directed toward improvement of the microelectronic circuits presented in this report and evaluation of circuits developed. Bar layouts are being processed for the circuits and data from the evaluation of circuits are being considered for approach possibilities. Activities on milliwatt logic semiconductor integrated circuits were directed toward providing equipment, and design for environmental test facilities. Cost reduction through larger wafers and better probes for thorough testing prior to packaging constituted a major project effort. (Author)