首页> 美国政府科技报告 >Research and Development Program Intrinsic Reliability Subminiature Ceramic Capacitors.
【24h】

Research and Development Program Intrinsic Reliability Subminiature Ceramic Capacitors.

机译:研发计划本质可靠性超小型陶瓷电容器。

获取原文

摘要

Testing of C67 Case Size I Monolythic capacitors of the improved version continues to demonstrate the long-life capability of this capacitor at use conditions. The testing of 124 of these capacitors at 200 VDC and 125 C for 2500 hr without catastrophic failure, then at 400 VDC and 125 C for 4000 hours with only five displaying any degradation, continues to indicate the intrinsic high reliability of this unit. (Author)

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号