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Capacitance Between Thin-Film Conductors Deposited on a High-Dielectricconstant Substrate

机译：在高介电常数衬底上沉积的薄膜导体之间的电容

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摘要

The capacitance between two thin-film conductors deposited on a high-dielectric-constant substrate is calculated by means of the Schwarz-Christoffel transformation. Numerical results are calculated and compared with experimental results. (Author)

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作者
Kaiser, H. R.; Castro, P. S.;
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年度 1965
页码 p.1-2
总页数 2
原文格式 PDF
正文语种 eng
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关键词
Capacitance ; Boundary value problems ; Mapping(Transformations) ; Electrical conductance ; Dielectrics ; Integrals;

机译：电容;边界值问题;映射（变换）;电导;电介质;积分;

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Capacitance Between Thin-Film Conductors Deposited on a High-Dielectricconstant Substrate

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