首页> 美国政府科技报告 >PRODUCTION ENGINEERING MEASURE: IMPROVEMENT OF PRODUCTION TECHNIQUES TO INCREASE THE RELIABILITY OF SILICON PLANAR EPITAXIAL; TRANSISTOR (WX-4001), LOGIC GATE (WM-201), FLIPFLOP (WM-202),AC BINARY (WM-213).
【24h】

PRODUCTION ENGINEERING MEASURE: IMPROVEMENT OF PRODUCTION TECHNIQUES TO INCREASE THE RELIABILITY OF SILICON PLANAR EPITAXIAL; TRANSISTOR (WX-4001), LOGIC GATE (WM-201), FLIPFLOP (WM-202),AC BINARY (WM-213).

机译:生产工程测量:改进生产技术以提高硅平面外延的可靠性; TRaNsIsTOR(WX-4001),LOGIC GaTE(Wm-201),FLIpFLOp(Wm-202),aC BINaRY(Wm-213)。

获取原文

摘要

Extensive studies of assembly and lidding procedures were performed,and significant improvements in yield and reliability are expected as a result of changes in manufacturing procedures. During the period, a number of reliability tests were completed,and many additional tests were begun. Final drafts of the specifications for all devices were undertaken and are practically complete. An outline of the revised quality control manual was finalized. Quarterly samples were delivered per the contract requirements. The most important development during the period was the institution of automatic testing of all devices on the program,using an in-house designed and built automatic test system which automatically tests all DC parameters,prints out the data,and punches a tape which can be used for computer handling of the data. (Author)

著录项

相似文献

  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号